11-03-2017, 03:09 PM
Nisam bio u pravu oko isključeno/uključeno.
"Electronics in operation vs. inactive
Equipment that is running at the time of an EMP is more vulnerable. Even a low-energy pulse has access to the power source, and all parts of the system are illuminated by the pulse. For example, a high-current arcing path may be created across the power supply, burning out some device along that path. Such effects are very hard to predict, and equipment needs high-level laboratory testing for vulnerabilities if it may be subjected to pulses.[38]"
"Electronics in operation vs. inactive
Equipment that is running at the time of an EMP is more vulnerable. Even a low-energy pulse has access to the power source, and all parts of the system are illuminated by the pulse. For example, a high-current arcing path may be created across the power supply, burning out some device along that path. Such effects are very hard to predict, and equipment needs high-level laboratory testing for vulnerabilities if it may be subjected to pulses.[38]"